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"Experimental characterization of critical high-electric field spots in ..."

Mauro Ciappa, Ying Pang, Chenchen Sun (2018)

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DOI: 10.1016/J.MICROREL.2018.07.129

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mauro Ciappa, Ying Pang, Chenchen Sun:
Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources. Microelectron. Reliab. 88-90: 476-481 (2018)

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