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"Strength of Ta-Si interfaces by molecular dynamics."

Pekka Heino, Eero Ristolainen (2003)

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DOI: 10.1016/S0026-2714(02)00325-6

access: closed

type: Journal Article

metadata version: 2023-09-20

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  - https://dblp.org/rec/journals/mr/HeinoR03
Pekka Heino, Eero Ristolainen:
Strength of Ta-Si interfaces by molecular dynamics. Microelectron. Reliab. 43(4): 645-650 (2003)

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