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"Reliability growth modeling for in-service electronic systems considering ..."

Tongdan Jin, Haitao Liao, Madhu Kilari (2010)

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DOI: 10.1016/J.MICROREL.2010.01.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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Tongdan Jin, Haitao Liao, Madhu Kilari:
Reliability growth modeling for in-service electronic systems considering latent failure modes. Microelectron. Reliab. 50(3): 324-331 (2010)

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