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"On the importance of the Vg, max-Vth parameter on ..."

Despina C. Moschou et al. (2010)

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DOI: 10.1016/J.MICROREL.2009.10.014

access: closed

type: Journal Article

metadata version: 2020-02-22

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Despina C. Moschou, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas:
On the importance of the V_{g, max}-V_th parameter on LTPS TFT stressing behavior. Microelectron. Reliab. 50(2): 190-194 (2010)

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