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"Review of bias-temperature instabilities at the III-N/dielectric interface."

Clemens Ostermaier et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.12.039

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/OstermaierLRP18
Clemens Ostermaier, Peter Lagger, M. Reiner, Dionyz Pogany:
Review of bias-temperature instabilities at the III-N/dielectric interface. Microelectron. Reliab. 82: 62-83 (2018)

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