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"A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA ..."

Aiwu Ruan et al. (2013)

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DOI: 10.1016/J.MICROREL.2012.09.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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Aiwu Ruan, Shi Kang, Yu Wang, Xiao Han, Zujian Zhu, Yongbo Liao, Peng Li:
A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis. Microelectron. Reliab. 53(3): 488-498 (2013)

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