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ORCID"Degradation of vertical GaN-on-GaN fin transistors: Step-stress and ..."
Maria Ruzzarin et al. (2018)
- Maria Ruzzarin
, Matteo Meneghini, Carlo De Santi, Min Sun, Tomás Palacios, Gaudenzio Meneghesso, Enrico Zanoni:
Degradation of vertical GaN-on-GaN fin transistors: Step-stress and constant voltage experiments. Microelectron. Reliab. 88-90: 620-626 (2018)
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