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"Fast identification of true critical paths in sequential circuits."

Raimund Ubar et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.11.027

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - https://dblp.org/rec/journals/mr/UbarKJRJ18
Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Lembit Jürimägi:
Fast identification of true critical paths in sequential circuits. Microelectron. Reliab. 81: 252-261 (2018)

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