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"Test generation for sequential circuits using parallel fault simulation ..."

Yuzo Takamatsu, Isao Higashi, Tsuyoshi Kodama (1995)

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DOI: 10.1002/SCJ.4690261003

access: closed

type: Journal Article

metadata version: 2023-09-13

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Yuzo Takamatsu, Isao Higashi, Tsuyoshi Kodama:
Test generation for sequential circuits using parallel fault simulation with random inputs. Syst. Comput. Jpn. 26(10): 24-34 (1995)

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