Stop the war!
Остановите войну!
for scientists:
default search action
"A Methodology to Predict the Impact of Substrate Noise in Analog/RF Systems."
Stephane Bronckers et al. (2009)
- Stephane Bronckers, Karen Scheir, Geert Van der Plas, Gerd Vandersteen, Yves Rolain:
A Methodology to Predict the Impact of Substrate Noise in Analog/RF Systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(11): 1613-1626 (2009)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.