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"Viterbi-Based Efficient Test Data Compression."

Dongsoo Lee, Kaushik Roy (2012)

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DOI: 10.1109/TCAD.2011.2172609

access: closed

type: Journal Article

metadata version: 2020-09-24

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Dongsoo Lee, Kaushik Roy:
Viterbi-Based Efficient Test Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(4): 610-619 (2012)

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