"A Self-Test on Wafer Level for a MEM Gyroscope Readout Based on ..."

Sebastian Nessler, Maximilian Marx, Yiannos Manoli (2018)

Details and statistics

DOI: 10.1109/TCSI.2017.2767199

access: closed

type: Journal Article

metadata version: 2020-05-22

a service of  Schloss Dagstuhl - Leibniz Center for Informatics