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"A reliability enhancement design under the flash translation layer for ..."

Yuan-Hao Chang et al. (2013)

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DOI: 10.1145/2512467

access: closed

type: Journal Article

metadata version: 2022-12-07

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Yuan-Hao Chang, Ming-Chang Yang, Tei-Wei Kuo, Ren-Hung Hwang:
A reliability enhancement design under the flash translation layer for MLC-based flash-memory storage systems. ACM Trans. Embed. Comput. Syst. 13(1): 10:1-10:28 (2013)

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