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"A Combined Design-Time/Test-Time Study of the Vulnerability of ..."

Alessandro Barenghi et al. (2014)

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DOI: 10.1109/TETC.2014.2316509

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/tetc/BarenghiHBSRK14
Alessandro Barenghi, Cédric Hocquet, David Bol, François-Xavier Standaert, Francesco Regazzoni, Israel Koren:
A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks. IEEE Trans. Emerg. Top. Comput. 2(2): 107-118 (2014)

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