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"High-Speed Embedded-Object Analysis Using a Dual-Line Timed-Address-Event ..."

Ahmed Nabil Belbachir et al. (2011)

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DOI: 10.1109/TIE.2010.2095390

access: closed

type: Journal Article

metadata version: 2020-05-22

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Ahmed Nabil Belbachir, Michael Hofstätter, Martin Litzenberger, Peter Schön:
High-Speed Embedded-Object Analysis Using a Dual-Line Timed-Address-Event Temporal-Contrast Vision Sensor. IEEE Trans. Ind. Electron. 58(3): 770-783 (2011)

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