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"High-resolution electron microscopy: from imaging toward measuring."

Sandra Van Aert et al. (2002)

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DOI: 10.1109/TIM.2002.802250

access: closed

type: Journal Article

metadata version: 2022-05-30

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Sandra Van Aert, Arnold J. den Dekker, Adriaan van den Bos, Dirk Van Dyck:
High-resolution electron microscopy: from imaging toward measuring. IEEE Trans. Instrum. Meas. 51(4): 611-615 (2002)

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