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"Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements."

Chih-Hung Chen et al. (2008)

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DOI: 10.1109/TIM.2008.925021

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - https://dblp.org/rec/journals/tim/ChenWBZ08
Chih-Hung Chen, Ying-Lien Wang, M. H. Bakr, Zheng Zeng:
Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements. IEEE Trans. Instrum. Meas. 57(11): 2462-2471 (2008)

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