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"Exponential Decay of Reconstruction Error From Binary Measurements of ..."

Richard G. Baraniuk et al. (2017)

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DOI: 10.1109/TIT.2017.2688381

access: closed

type: Journal Article

metadata version: 2023-08-28

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Richard G. Baraniuk, Simon Foucart, Deanna Needell, Yaniv Plan, Mary Wootters:
Exponential Decay of Reconstruction Error From Binary Measurements of Sparse Signals. IEEE Trans. Inf. Theory 63(6): 3368-3385 (2017)

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