Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Optimal Selection of Imperfect Tests for Fault Detection and Isolation."

Shigang Zhang et al. (2013)

> Home

Details and statistics

DOI: 10.1109/TSMC.2013.2244210

access: closed

type: Journal Article

metadata version: 2020-05-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tsmc/ZhangPHW13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tsmc/ZhangPHW13
Shigang Zhang, Krishna R. Pattipati, Zheng Hu, Xisen Wen:
Optimal Selection of Imperfect Tests for Fault Detection and Isolation. IEEE Trans. Syst. Man Cybern. Syst. 43(6): 1370-1384 (2013)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.