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"A new maximal diagnosis algorithm for interconnect test."

YongJoon Kim, Hyun-Don Kim, Sungho Kang (2004)

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DOI: 10.1109/TVLSI.2004.826200

access: closed

type: Journal Article

metadata version: 2024-02-27

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YongJoon Kim, Hyun-Don Kim, Sungho Kang:
A new maximal diagnosis algorithm for interconnect test. IEEE Trans. Very Large Scale Integr. Syst. 12(5): 532-537 (2004)

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