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"PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration."

Moo-young Kim, Hokyu Lee, Chulwoo Kim (2012)

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DOI: 10.1109/TVLSI.2011.2109971

access: closed

type: Journal Article

metadata version: 2020-03-11

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  dblp key:
  - journals/tvlsi/KimLK12
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  - https://dblp.org/rec/journals/tvlsi/KimLK12
Moo-young Kim, Hokyu Lee, Chulwoo Kim:
PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration. IEEE Trans. Very Large Scale Integr. Syst. 20(4): 737-741 (2012)

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