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"Novel Circuit-Level Model for Gate Oxide Short and its Testing Method in ..."

Chen-Wei Lin, Mango Chia-Tso Chao, Chih-Chieh Hsu (2014)

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DOI: 10.1109/TVLSI.2013.2268984

access: closed

type: Journal Article

metadata version: 2020-03-11

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Chen-Wei Lin, Mango Chia-Tso Chao, Chih-Chieh Hsu:
Novel Circuit-Level Model for Gate Oxide Short and its Testing Method in SRAMs. IEEE Trans. Very Large Scale Integr. Syst. 22(6): 1294-1307 (2014)

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