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"SACCI: Scan-Based Characterization Through Clock Phase Sweep for ..."
Yu Zheng, Xinmu Wang, Swarup Bhunia (2015)
- Yu Zheng, Xinmu Wang, Swarup Bhunia:
SACCI: Scan-Based Characterization Through Clock Phase Sweep for Counterfeit Chip Detection. IEEE Trans. Very Large Scale Integr. Syst. 23(5): 831-841 (2015)
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