"Deterioration Behavior Analysis and LSTM-Based Failure Prediction of GIB ..."

Xiangyu Guan et al. (2020)

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DOI: 10.1109/ACCESS.2020.3017217

access: open

type: Journal Article

metadata version: 2020-09-19

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Xiangyu Guan, Yuequan Wen, Zhe Dong, Naiqiu Shu, Hui Peng, Wei Gao, David Wenzhong Gao:
Deterioration Behavior Analysis and LSTM-Based Failure Prediction of GIB Electrical Contact Inside Various Insulation Gases. IEEE Access 8: 152367-152376 (2020)

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