"Reassessing March Test Effectiveness in System Memory Error Detection ..."

Jeonghwan Kim, Sanghyeon Baeg (2025)

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DOI: 10.1109/ACCESS.2025.3645136

access: open

type: Journal Article

metadata version: 2026-01-09

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Jeonghwan Kim, Sanghyeon Baeg:
Reassessing March Test Effectiveness in System Memory Error Detection Through Inductive Fault Analysis. IEEE Access 13: 213808-213823 (2025)

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