"Ensemble Learning for Wafer Defect Pattern Classification in the ..."

Chia-Yun Lee et al. (2025)

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DOI: 10.1109/ACCESS.2025.3604405

access: open

type: Journal Article

metadata version: 2025-10-15

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Chia-Yun Lee, Matús Pleva, Daniel Hládek, Chin-We Lee, Ming-Hsiang Su:
Ensemble Learning for Wafer Defect Pattern Classification in the Semiconductor Industry. IEEE Access 13: 155714-155728 (2025)

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