"High-Efficiency and High-Reliability Deep-UV Light-Emitting Diodes Using ..."

Tae Hoon Park et al. (2021)

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DOI: 10.1109/ACCESS.2021.3136351

access: open

type: Journal Article

metadata version: 2022-01-08

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Tae Hoon Park, Kyung Rock Son, Hideki Hirayama, Tae Geun Kim:
High-Efficiency and High-Reliability Deep-UV Light-Emitting Diodes Using Transparent Ni-Implanted AlN Ohmic Electrodes. IEEE Access 9: 166617-166623 (2021)

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