"Signal-to-Noise Ratio in Scanning Electron Microscopy: A Comprehensive Review."

Kok Swee Sim et al. (2025)

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DOI: 10.1109/ACCESS.2025.3603013

access: open

type: Journal Article

metadata version: 2025-10-15

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Kok Swee Sim, Iksan Bukhori, Dominic Chee Yong Ong, Gan Kok Beng:
Signal-to-Noise Ratio in Scanning Electron Microscopy: A Comprehensive Review. IEEE Access 13: 154395-154421 (2025)

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