"Design of Intelligent Circuit Characteristic Tester for Use in Harsh ..."

Xiaonan Zhao, Shuai Deng, Yang Li (2020)

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DOI: 10.1109/ACCESS.2020.3005175

access: open

type: Journal Article

metadata version: 2020-10-14

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Xiaonan Zhao, Shuai Deng, Yang Li:
Design of Intelligent Circuit Characteristic Tester for Use in Harsh Environments. IEEE Access 8: 119511-119515 (2020)

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