"EBL: Efficient background learning for x-ray security inspection."

Wei Wang et al. (2023)

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DOI: 10.1007/S10489-022-04075-1

access: closed

type: Journal Article

metadata version: 2023-09-30

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Wei Wang, Linyang He, Yiqing Li, Kai Zhou, Linchao Li, Guohua Cheng, Ting Wen:
EBL: Efficient background learning for x-ray security inspection. Appl. Intell. 53(9): 11357-11372 (2023)

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