"An improved test process model for cost reduction."

Suresh Goyal, James H. Mosher Jr. (2006)

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DOI: 10.1002/BLTJ.20151

access: closed

type: Journal Article

metadata version: 2020-02-27

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Suresh Goyal, James H. Mosher Jr.:
An improved test process model for cost reduction. Bell Labs Tech. J. 11(1): 173-190 (2006)

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