"Remaining useful life prediction for multiple degradation indicators ..."

Bin Wu et al. (2023)

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DOI: 10.1016/J.CIE.2023.109736

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type: Journal Article

metadata version: 2024-08-04

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Bin Wu, Jianchao Zeng, Hui Shi, Xiaohong Zhang, Yankai Qin:
Remaining useful life prediction for multiple degradation indicators systems considering random correlation. Comput. Ind. Eng. 186: 109736 (2023)

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