Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"An automatic defect detection method for TO56 semiconductor laser using ..."

Hang Zhang et al. (2023)

> Home

Details and statistics

DOI: 10.1016/J.CIE.2023.109148

access: closed

type: Journal Article

metadata version: 2023-05-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/candie/ZhangLZLC23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/candie/ZhangLZLC23
Hang Zhang, Rong Li, Dexiang Zou, Jian Liu, Ning Chen:
An automatic defect detection method for TO56 semiconductor laser using deep convolutional neural network. Comput. Ind. Eng. 179: 109148 (2023)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.