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"Feature space monitoring for smart manufacturing via statistics pattern ..."

Q. Peter He, Jin Wang, Devarshi Shah (2019)

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DOI: 10.1016/J.COMPCHEMENG.2019.04.010

access: closed

type: Journal Article

metadata version: 2023-09-30

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Q. Peter He, Jin Wang, Devarshi Shah:
Feature space monitoring for smart manufacturing via statistics pattern analysis. Comput. Chem. Eng. 126: 321-331 (2019)

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