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"Breakdown voltage analysis for the new RESURF AlGaN/GaN HEMTs."

Baoxing Duan, Yintang Yang (2012)

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DOI: 10.1007/S11432-011-4496-0

access: closed

type: Journal Article

metadata version: 2023-11-16

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  dblp key:
  - journals/chinaf/DuanY12
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  - https://dblp.org/rec/journals/chinaf/DuanY12
Baoxing Duan, Yintang Yang:
Breakdown voltage analysis for the new RESURF AlGaN/GaN HEMTs. Sci. China Inf. Sci. 55(2): 473-479 (2012)

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