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"Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in ..."
Yibai He, Shuming Chen (2014)
- Yibai He, Shuming Chen:
Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in 65-nm bulk CMOS technology. Sci. China Inf. Sci. 57(10): 1-7 (2014)
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