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"Tough Challenges as Design and Test Go Nanometer - Guest Editors' ..."

Rohit Kapur, Thomas W. Williams (1999)

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DOI: 10.1109/2.803639

access: closed

type: Journal Article

metadata version: 2020-08-12

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  persistent URL:
  - https://dblp.org/rec/journals/computer/KapurW99
Rohit Kapur, Thomas W. Williams:
Tough Challenges as Design and Test Go Nanometer - Guest Editors' Introduction. Computer 32(11): 42-45 (1999)

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