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"Mapping Patent Classifications: Portfolio and Statistical Analysis, and ..."
Loet Leydesdorff, Dieter Franz Kogler, Bowen Yan (2017)
- Loet Leydesdorff, Dieter Franz Kogler, Bowen Yan:
Mapping Patent Classifications: Portfolio and Statistical Analysis, and the Comparison of Strengths and Weaknesses. CoRR abs/1702.07481 (2017)
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