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"Comparing different solutions for testing resistive defects in low-power ..."

Nunzio Mirabella et al. (2021)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2022-01-05

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-2112-15176
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-2112-15176
Nunzio Mirabella, Michelangelo Grosso, Giovanna Franchino, Salvatore Rinaudo, Ioannis Deretzis, Antonino La Magna, Matteo Sonza Reorda:
Comparing different solutions for testing resistive defects in low-power SRAMs. CoRR abs/2112.15176 (2021)

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