"On-demand Test-time Adaptation for Edge Devices."

Xiao Ma, Young D. Kwon, Dong Ma (2025)

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DOI: 10.48550/ARXIV.2505.00986

access: open

type: Informal or Other Publication

metadata version: 2025-06-18

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  - journals/corr/abs-2505-00986
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  - https://dblp.org/rec/journals/corr/abs-2505-00986
Xiao Ma, Young D. Kwon, Dong Ma:
On-demand Test-time Adaptation for Edge Devices. CoRR abs/2505.00986 (2025)

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