"Dimensional metrology interoperability and standardization in ..."

Yaoyao Fiona Zhao et al. (2011)

> Home

Details and statistics

DOI: 10.1016/J.CSI.2011.02.009

access: closed

type: Journal Article

metadata version: 2020-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/csi/ZhaoXKPH11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/csi/ZhaoXKPH11
Yaoyao Fiona Zhao, Xun Xu, Tom Kramer, Frederick M. Proctor, John Horst:
Dimensional metrology interoperability and standardization in manufacturing systems. Comput. Stand. Interfaces 33(6): 541-555 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.