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"A hierarchical Bayes analysis for one-shot device testing experiment under ..."

Reema Sharma, S. K. Upadhyay (2018)

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DOI: 10.1080/03610918.2017.1310233

access: closed

type: Journal Article

metadata version: 2020-05-10

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Reema Sharma, S. K. Upadhyay:
A hierarchical Bayes analysis for one-shot device testing experiment under the assumption of exponentiality. Commun. Stat. Simul. Comput. 47(5): 1297-1314 (2018)

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