"Force field feature extraction for ear biometrics."

David J. Hurley, Mark S. Nixon, John N. Carter (2005)

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DOI: 10.1016/J.CVIU.2004.11.001

access: closed

type: Journal Article

metadata version: 2020-02-21

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David J. Hurley, Mark S. Nixon, John N. Carter:
Force field feature extraction for ear biometrics. Comput. Vis. Image Underst. 98(3): 491-512 (2005)

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