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"Testing of Stuck-Open Faults in Nanometer Technologies."

Víctor H. Champac et al. (2012)

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DOI: 10.1109/MDT.2012.2205609

access: closed

type: Journal Article

metadata version: 2022-10-02

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  - https://dblp.org/rec/journals/dt/ChampacHBGHS12
Víctor H. Champac, Julio Vazquez Hernandez, Salvador Barcelo, Roberto Gómez, Chuck Hawkins, Jaume Segura:
Testing of Stuck-Open Faults in Nanometer Technologies. IEEE Des. Test Comput. 29(4): 80-91 (2012)

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