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"Defect-Oriented Testing and Defective-Part-Level Prediction."

Jennifer Dworak et al. (2001)

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DOI: 10.1109/54.902820

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/DworakWLGMBSW01
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  persistent URL:
  - https://dblp.org/rec/journals/dt/DworakWLGMBSW01
Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang:
Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Des. Test Comput. 18(1): 31-41 (2001)

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