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"Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die ..."

Ke Huang et al. (2015)

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DOI: 10.1109/MDAT.2014.2361721

access: closed

type: Journal Article

metadata version: 2022-04-27

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Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris:
Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. IEEE Des. Test 32(1): 53-60 (2015)

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