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"Resistance Characterization for Weak Open Defects."

Rosa Rodríguez-Montañés, Paul Volf, José Pineda de Gyvez (2002)

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DOI: 10.1109/MDT.2002.1033788

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/Rodriguez-MontanesVG02
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  persistent URL:
  - https://dblp.org/rec/journals/dt/Rodriguez-MontanesVG02
Rosa Rodríguez-Montañés, Paul Volf, José Pineda de Gyvez:
Resistance Characterization for Weak Open Defects. IEEE Des. Test Comput. 19(5): 18-26 (2002)

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