"Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Masaki Tsukude et al. (1993)

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DOI: 10.1109/54.211523

access: closed

type: Journal Article

metadata version: 2020-05-17

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Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsuhiro Suma, Kazuyasu Fujishima:
Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters. IEEE Des. Test Comput. 10(2): 6-12 (1993)

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