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"Reducing Burn-in Time through High-Voltage Stress Test and Weibull ..."

Mohd Fairuz Zakaria et al. (2006)

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DOI: 10.1109/MDT.2006.50

access: closed

type: Journal Article

metadata version: 2022-10-02

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  persistent URL:
  - https://dblp.org/rec/journals/dt/ZakariaKOD06
Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko:
Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis. IEEE Des. Test Comput. 23(2): 88-98 (2006)

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