"A generative-adversarial-network-based temporal raw trace data ..."

Shu-Kai S. Fan, Wei-Yu Chen (2025)

> Home

Details and statistics

DOI: 10.1016/J.ENGAPPAI.2024.109624

access: closed

type: Journal Article

metadata version: 2025-03-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/eaai/FanC25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/eaai/FanC25
Shu-Kai S. Fan, Wei-Yu Chen:
A generative-adversarial-network-based temporal raw trace data augmentation framework for fault detection in semiconductor manufacturing. Eng. Appl. Artif. Intell. 139: 109624 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.